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説明:

We propose an automated method for threshold analysis in photoelectron yield spectroscopy (PYS), a technique used for measuring the ionization energy of inorganic and organic semiconductors. PYS spectra can be interpreted using the power law. First, the analysis region, the region of interest (ROI), within the measured spectrum must be identified and isolated for power law interpretation. Segment regression is employed to estimate the change point of the spectrum and slope on either side. The ROI is extracted using an algorithm that accounts for the slope variation (PW-ROI method). The inverse of the power number (n) derived from the physical model is then applied to the spectrum, and fitting is performed using the mean absolute error as the minimization function with the extended rectified linear unit function (1/n plot method). In cases with multiple candidate models, the optimal model is chosen based on the coefficient of determination using the 1/n plot method. This automated analysis method significantly reduces the processing time and ensures that the values are objective and human independent. Results of automated analysis closely align with those of manual analysis, with their differences limited within the range of ±0.1 eV.

権利情報:

• Creative Commons BY Attribution 4.0 International
  

キーワード: Material informatics, automated analysis, power law, photoelectron yieldspectroscopy

刊行年月日: 2025-12-31

出版者: Informa UK Limited

掲載誌:

• Science and Technology of Advanced Materials: Methods (ISSN: 27660400) vol. 5 issue. 1

研究助成金:

• the Research Center for Electronic and Optical Materials in National Institute for Materials Science
• Materials Exploration space Expansion Platform JPMJMI21G2

原稿種別: 出版者版 (Version of record)

MDR DOI:

公開URL: https://doi.org/10.1080/27660400.2025.2465257

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更新時刻: 2025-04-25 09:19:34 +0900

MDRでの公開時刻: 2025-04-25 12:19:14 +0900