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We have studied the Pockels effect, that is, the linear change in the refractive index of piezoelectric materials in response to an electric field, in monolayer and bilayer MoS2 films grown by a chemical vapor deposition method. Optical imaging of the polarization rotation of the reflected light reveals that the polarization plane rotates by the application of an electric field only in monolayer MoS2 which lacks inversion symmetry. The Pockels coefficient r22 is estimated to be −1.4 pm/V for monolayer MoS2, which is comparable to the magnitude reported for GaAs.

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• Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
  

  This is the Accepted Manuscript version of an article accepted for publication in Japanese Journal of Applied Physics. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at https://doi.org/10.35848/1347-4065/add5b2.

Keyword: MoS2, Pockels effect

Date published: 2025-05-01

Publisher: IOP Publishing

Journal:

• Japanese Journal of Applied Physics (ISSN: 00214922) vol. 64 issue. 5 055002

Funding:

• Fusion Oriented REsearch for disruptive Science and Technology JPMJFR203H
• Japan Society for the Promotion of Science JP21H05232

Manuscript type: Author's version (Accepted manuscript)

MDR DOI: https://doi.org/10.48505/nims.5682

First published URL: https://doi.org/10.35848/1347-4065/add5b2

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Updated at: 2026-02-14 20:32:38 +0900

Published on MDR: 2026-05-26 08:33:05 +0900