Bo Da
(National Institute for Materials Science
)
;
Jiangwei Liu
(National Institute for Materials Science)
;
Mahito Yamamoto
;
Yoshihiro Ueda
;
Kazuyuki Watanabe
;
Nguyen Thanh Cuong
;
Songlin Li
;
Kazuhito Tsukagoshi
(National Institute for Materials Science)
;
Hideki Yoshikawa
(National Institute for Materials Science)
;
Hideo Iwai
(National Institute for Materials Science)
;
Shigeo Tanuma
(National Institute for Materials Science)
;
Hongxuan Guo
;
Zhaoshun Gao
;
Xia Sun
;
Zejun Ding
コレクション
引用
代替タイトル: Virtual substrate method for nanomaterials characterization
説明:
(abstract)Characterization techniques available for bulk or thin-film solid-state materials have been extended to substrate-supported nanomaterials, but generally non-quantitatively. This is because the nanomaterial signals are inevitably buried in the signals from the underlying substrate in common reflection-configuration techniques. Here, we propose a virtual substrate method to characterize nanomaterials without the influence of underlying substrate signals from four interrelated measurements. The virtual substrate method represents a benchmark for surface analysis to provide “free-standing” information about supported nanomaterials.
権利情報:
-
Creative Commons BY Attribution 4.0 International
Creative Commons BY Attribution 4.0 International
キーワード: Virtual substrate method
刊行年月日: 2017-05-26
出版者: Springer Science and Business Media LLC
掲載誌:
- NATURE COMMUNICATIONS (ISSN: 20411723) vol. 8 15629
研究助成金:
原稿種別: 出版者版 (Version of record)
MDR DOI:
公開URL: https://doi.org/10.1038/ncomms15629
関連資料:
その他の識別子:
連絡先:
更新時刻: 2024-01-05 22:11:56 +0900
MDRでの公開時刻: 2023-02-28 11:37:12 +0900
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