Bo Da
(National Institute for Materials Science
)
;
Jiangwei Liu
(National Institute for Materials Science)
;
Mahito Yamamoto
;
Yoshihiro Ueda
;
Kazuyuki Watanabe
;
Nguyen Thanh Cuong
;
Songlin Li
;
Kazuhito Tsukagoshi
(National Institute for Materials Science)
;
Hideki Yoshikawa
(National Institute for Materials Science)
;
Hideo Iwai
(National Institute for Materials Science)
;
Shigeo Tanuma
(National Institute for Materials Science)
;
Hongxuan Guo
;
Zhaoshun Gao
;
Xia Sun
;
Zejun Ding
Collection
Citation
Alternative title: Virtual substrate method for nanomaterials characterization
Description:
(abstract)Characterization techniques available for bulk or thin-film solid-state materials have been extended to substrate-supported nanomaterials, but generally non-quantitatively. This is because the nanomaterial signals are inevitably buried in the signals from the underlying substrate in common reflection-configuration techniques. Here, we propose a virtual substrate method to characterize nanomaterials without the influence of underlying substrate signals from four interrelated measurements. The virtual substrate method represents a benchmark for surface analysis to provide “free-standing” information about supported nanomaterials.
Rights:
-
Creative Commons BY Attribution 4.0 International
Creative Commons BY Attribution 4.0 International
Keyword: Virtual substrate method
Date published: 2017-05-26
Publisher: Springer Science and Business Media LLC
Journal:
- NATURE COMMUNICATIONS (ISSN: 20411723) vol. 8 15629
Funding:
Manuscript type: Publisher's version (Version of record)
MDR DOI:
First published URL: https://doi.org/10.1038/ncomms15629
Related item:
Other identifier(s):
Contact agent:
Updated at: 2024-01-05 22:11:56 +0900
Published on MDR: 2023-02-28 11:37:12 +0900
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