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代替タイトル: Virtual substrate method for nanomaterials characterization

説明:

Characterization techniques available for bulk or thin-film solid-state materials have been extended to substrate-supported nanomaterials, but generally non-quantitatively. This is because the nanomaterial signals are inevitably buried in the signals from the underlying substrate in common reflection-configuration techniques. Here, we propose a virtual substrate method to characterize nanomaterials without the influence of underlying substrate signals from four interrelated measurements. The virtual substrate method represents a benchmark for surface analysis to provide “free-standing” information about supported nanomaterials.

権利情報:

• Creative Commons BY Attribution 4.0 International
  

  Creative Commons BY Attribution 4.0 International

キーワード: Virtual substrate method

刊行年月日: 2017-05-26

出版者: Springer Science and Business Media LLC

掲載誌:

• NATURE COMMUNICATIONS (ISSN: 20411723) vol. 8 15629

研究助成金:

原稿種別: 出版者版 (Version of record)

MDR DOI:

公開URL: https://doi.org/10.1038/ncomms15629

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更新時刻: 2024-01-05 22:11:56 +0900

MDRでの公開時刻: 2023-02-28 11:37:12 +0900