Kenji Yamaguchi
;
Takuya Ishigaki
;
Yuki Inoue
;
Shuhei Arisawa
;
Hirotaka Matsunoshita
;
Yuki Ito
;
Hiroyuki Mori
;
Ken’ichiro Suehiro
;
Kazunari Maki
;
Kenji Nagata
(National Institute for Materials Science
)
;
Masahiko Demura
(National Institute for Materials Science
)
Description:
(abstract)A comprehensive elemental screening framework is proposed to predict the solid-solution strengthening and electrical resistivity of copper alloys. Electrical resistivities are predicted by first-principles calculations, and a high degree of accuracy is obtained.
Rights:
Keyword: Alloy design, Copper alloys, Mechanical properties, Electrical resistivity / conductivity, Density functional theory (DFT)
Date published: 2023-12-31
Publisher: Informa UK Limited
Journal:
Funding:
Manuscript type: Publisher's version (Version of record)
MDR DOI:
First published URL: https://doi.org/10.1080/27660400.2023.2250704
Related item:
Other identifier(s):
Contact agent:
Updated at: 2024-01-05 22:11:53 +0900
Published on MDR: 2023-11-02 13:30:11 +0900
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Comprehensive elemental screening of solid-solution copper alloys.pdf
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