J. R. Stellhorn
;
A. Masuno
;
Y. Onodera
;
S. Kohara
;
K. Yoshida
;
Y. Yanaba
;
H. Inoue
;
T. Ohkubo
;
H. Taniguchi
Description:
(abstract)The amorphous phase of bismuth silicate (Bi2SiO5) is characterized by an exceptionally large
dielectric permittivity over a wide temperature range. This study explores the relationship between
this remarkable property and the material’s atomic-scale structure, which has been modeled from
experimental X-ray and neutron scattering as well as EXAFS and NMR spectroscopy data in a
Reverse Monte-Carlo approach. The resulting structural model is analyzed to reveal short- and
intermediate-range features on the atomic scale.
Our results show that the exceptional dielectric performance stems from the asymmetric coor-
dination of Bi-Ox polyhedra as well as a nano-segregation induced by SiO4 chains, which together
boost local polarizability. These findings establish a direct link between disordered atomic struc-
tures and enhanced dielectric properties, and sets a new benchmark for amorphous materials.
Rights:
©2026 American Physical Society
Keyword: Glass, Dielectric permittivity, diffraction
Date published: 2026-01-20
Publisher: American Physical Society (APS)
Journal:
Funding:
Manuscript type: Author's version (Accepted manuscript)
MDR DOI: https://doi.org/10.48505/nims.6160
First published URL: https://doi.org/10.1103/tg5g-dvgs
Related item:
Other identifier(s):
Contact agent:
Updated at: 2026-01-21 13:28:37 +0900
Published on MDR: 2026-01-21 16:21:18 +0900
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