Download file (3.19MB)
Download as zip (3.1MB)

コレクション

引用

説明:

The amorphous phase of bismuth silicate (Bi2SiO5) is characterized by an exceptionally large
dielectric permittivity over a wide temperature range. This study explores the relationship between
this remarkable property and the material’s atomic-scale structure, which has been modeled from
experimental X-ray and neutron scattering as well as EXAFS and NMR spectroscopy data in a
Reverse Monte-Carlo approach. The resulting structural model is analyzed to reveal short- and
intermediate-range features on the atomic scale.
Our results show that the exceptional dielectric performance stems from the asymmetric coor-
dination of Bi-Ox polyhedra as well as a nano-segregation induced by SiO4 chains, which together
boost local polarizability. These findings establish a direct link between disordered atomic struc-
tures and enhanced dielectric properties, and sets a new benchmark for amorphous materials.

権利情報:

• In Copyright
  

  ©2026 American Physical Society

キーワード: Glass, Dielectric permittivity, diffraction

刊行年月日: 2026-01-20

出版者: American Physical Society (APS)

掲載誌:

• Physical Review B (ISSN: 24699950) vol. 113 issue. 1 014201

研究助成金:

• Japan Society for the Promotion of Science 20H05878
• Japan Society for the Promotion of Science 20H05879
• Japan Society for the Promotion of Science 20H05880
• Ministry of Education, Culture, Sports, Science and Technology JPJ009777
• Japan Society for the Promotion of Science 20H02429
• Japan Society for the Promotion of Science 20K15027
• Japan Society for the Promotion of Science 21K18800

原稿種別: 著者最終稿 (Accepted manuscript)

MDR DOI: https://doi.org/10.48505/nims.6160

公開URL: https://doi.org/10.1103/tg5g-dvgs

関連資料:

その他の識別子:

連絡先:

更新時刻: 2026-01-21 13:28:37 +0900

MDRでの公開時刻: 2026-01-21 16:21:18 +0900