J. D. Albar
;
A. Summerfield
;
T. S. Cheng
;
A. Davies
;
E. F. Smith
;
A. N. Khlobystov
;
C. J. Mellor
;
T. Taniguchi
(National Institute for Materials Science)
;
K. Watanabe
(National Institute for Materials Science)
;
C. T. Foxon
;
L. Eaves
;
P. H. Beton
;
S. V. Novikov
説明:
(abstract)We report the use of a novel atomic carbon source for the MBE of graphene layers on hBN flakes and on sapphire wafers at substrate growth temperatures between 1400 and 1500C. The source produces a flux of predominantly atomic carbon, which diffuses through the walls of a Joule-heated tantalum tube filled with graphite powder. We demonstrate deposition of carbon on sapphire with carbon deposition rates up to 12 nm/h. AFM measurements reveal the formation of hexagonal moire patterns when graphene monolayers are grown on hBN flakes under optimum conditions. At MBE growth temperatures we observe etching of the sapphire wafer surface by the flux from the atomic carbon source, which we have not observed in the MBE growth of graphene with the sublimation carbon source.
権利情報:
キーワード: Atomic carbon source, molecular beam epitaxy, graphene
刊行年月日: 2017-07-26
出版者: Springer Science and Business Media LLC
掲載誌:
研究助成金:
原稿種別: 出版者版 (Version of record)
MDR DOI:
公開URL: https://doi.org/10.1038/s41598-017-07021-1
関連資料:
その他の識別子:
連絡先:
更新時刻: 2025-02-28 16:31:00 +0900
MDRでの公開時刻: 2025-02-28 16:31:00 +0900
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s41598-017-07021-1.pdf
(サムネイル)
application/pdf |
サイズ | 1.7MB | 詳細 |