Exploration of Degradation in Perovskite Solar Cells via Thermal Hysteresis of Photocurrent and Capacitance

KHADKA Dhruba Bahadur; YANAGIDA Masatoshi; SHIRAI Yasuhiro

Poster Exploration of Degradation in Perovskite Solar Cells via Thermal Hysteresis of Photocurrent and Capacitance

KHADKA Dhruba Bahadur (Research Center for Energy and Environmental Materials (GREEN)/Battery and Cell Materials Field/Photovoltaic Materials Group, National Institute for Materials Science) ; YANAGIDA Masatoshi (Research Center for Energy and Environmental Materials (GREEN)/Battery and Cell Materials Field/Photovoltaic Materials Group, National Institute for Materials Science) ; SHIRAI Yasuhiro (Research Center for Energy and Environmental Materials (GREEN)/Battery and Cell Materials Field/Photovoltaic Materials Group, National Institute for Materials Science)

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KHADKA Dhruba Bahadur, YANAGIDA Masatoshi, SHIRAI Yasuhiro. Exploration of Degradation in Perovskite Solar Cells via Thermal Hysteresis of Photocurrent and Capacitance. https://doi.org/10.48505/nims.5559

(BibTeX)

Alternative title: 光電流と静電容量の熱ヒステリシスによるペロブスカイト太陽電池の劣化の調査

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(abstract)

Understanding the degradation mechanisms in perovskite solar cells (PSCs) is critical to addressing their stability challenges and ensuring their reliability for long-term applications.1,2 Among the various performance issues, photocurrent loss is a prominent indicator of degradation in PSCs, directly impacting their efficiency and operational lifespan.3,4 This study investigates the underlying processes contributing to degradation, focusing on the thermal hysteresis of photocurrent (THPC) and the role of thermally activated ionic and recombination dynamics.5 THPC in degraded devices reveals a significantly higher variation in photogenerated current compared to pristine devices.
Capacitance analysis supports the role of interfacial ionic charges and active defects in the degradation process.6,7 Degraded devices exhibit increased capacitance, which corresponds to the presence of localized ionic charges and defects at critical interfaces. These ionic charges create localized electric fields, which intensify recombination losses and hinder efficient charge transport within the device.8 The interplay of these effects exacerbates the degradation of PSCs under operational conditions. The simulations confirm that these interfacial defects are particularly detrimental in the presence of thermally activated ionic processes, which amplify their negative effects under prolonged thermal and photonic exposure. This study highlights the strong connection between PSC degradation and the presence of thermally activated traps and interfacial charge accumulation, emphasizing the critical need to passivate these pathways to enhance device stability.

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