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In situ structural analysis under loads of amorphous
adhesives buried between metal substrates was conducted by using
synchrotron X-ray nanobeam diffraction and an embedded local
strain probe. Thermoplastic resins composed of polyrotaxanes,
featuring bulky cyclic molecules threaded with a linear polymer,
were sandwiched between stainless-steel substrates with diffraction
data attributed to the correlation distance between their cyclic
components being collected. The nanobeam was irradiated parallel
to the substrates and scanned, while distances from the substrate
were changed to obtain depth profiles of correlation distance.
Then, tensile loads were applied stepwise to the sandwiched sample
to reveal local strain distributions of the resins under different
loads. Different strain distributions and their changes with loads
were observed in resins with different adhesive strengths. The sample with strong adhesion showed pronounced strain localization near the interface between resin and substrate, whereas the weak sample displayed moderate strain further from the interface, with negligible strain near the interface. When the load increased, localized strain saturation occurred, followed by strain propagation into adjacent areas, indicative of a typical strain delocalization process associated with strain hardening near a highly constrained interface by substrates. This analysis elucidated the deformation and fracture processes of buried polymers, offering insight into those adhesive strength differences phenomenologically. This in situ analysis of local strain distribution contributes to comprehending adhesion mechanisms required for advancing multimaterialization technology and holds applicability to materials with buried interfaces such as nanocomposites.

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  This document is the Accepted Manuscript version of a Published Work that appeared in final form in The Journal of Physical Chemistry C, copyright © 2024 American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see https://doi.org/10.1021/acs.jpcc.4c02362

Keyword: adhesion, buried interface, X-ray nanobeam diffraction, strain-distribution analysis, deformation and fracture processes, polyrotaxane, strain delocalization

Date published: 2024-06-13

Publisher: American Chemical Society (ACS)

Journal:

• The Journal of Physical Chemistry C (ISSN: 19327447) vol. 128 issue. 23 p. 9785-9792

Funding:

• Japan Society for the Promotion of Science 20H02794

Manuscript type: Author's version (Accepted manuscript)

MDR DOI: https://doi.org/10.48505/nims.4782

First published URL: https://doi.org/10.1021/acs.jpcc.4c02362

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Updated at: 2025-06-19 08:30:18 +0900

Published on MDR: 2025-06-19 01:41:26 +0900