Guo Chen
;
Satoshi Koizumi
(National Institute for Materials Science
)
;
Yasuo Koide
(National Institute for Materials Science
)
;
Meiyong Liao
(National Institute for Materials Science
)
Description:
(abstract)In this Account, we provide an overview of the recent research and strategies in SCD diamond MEMS for achieving high Q-factors, focusing on those fabricated by the smart-cut method developed in our lab. We start with the concept of diamond MEMS, covering structure fabrication, fundamentals, and applications. A comprehensive discussion of the energy dissipation mechanisms on the Q factors in diamond MEMS resonators is provided. The approaches to enhance the Q-factor of diamond resonators including (1) the
growth of high crystal quality SCD epilayer on the ion-implanted substrate, (2) defects engineering, and (3) strain engineering by thinning the resonator to around 100 nm thick are presented. In the smart-cut method, the ∼100 nm thick defective layer contributes to the main intrinsic energy loss. By combing the growth of a high crystal quality diamond epilayer above the defective layer and the atomic scale etching of the defective layer, the Q-factors could be improved from thousands to over one million at room temperature, the highest among all the semiconductors. The intrinsic high Q-factors of SCD MEMS are also due to the well controlled
purity of the diamond epilayer and the ultrawide bandgap energy of diamond. Through strain engineering of the SCD MEMS beam to nanoscale, the Q-factor is expected to be further enhanced. These strategies
represent pivotal steps in advancing the performance and applicability of diamond MEMS resonators.
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Date published: 2024-09-27
Publisher: American Chemical Society (ACS)
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Funding:
Manuscript type: Author's version (Accepted manuscript)
MDR DOI: https://doi.org/10.48505/nims.4838
First published URL: https://doi.org/10.1021/accountsmr.4c00139
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Updated at: 2024-10-11 13:25:28 +0900
Published on MDR: 2025-07-29 08:17:54 +0900
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