論文 The CIGS semiconductor detector for particle physics

M. Togawa ORCID ; S. Fujii ; M. Imura SAMURAI ORCID ; K. Itabashi ; T. Isobe ; M. Miyahara ; J. Nishinaga ; H. Okumura

コレクション

引用
M. Togawa, S. Fujii, M. Imura, K. Itabashi, T. Isobe, M. Miyahara, J. Nishinaga, H. Okumura. The CIGS semiconductor detector for particle physics. Journal of Instrumentation. 2024, 19 (), . https://doi.org/10.1088/1748-0221/19/05/c05042
SAMURAI

説明:

(abstract)

Silicon is commonly used as a sensor material in a wide variety of imaging application. In recent high-energy and intensity beam experiments, high radiation tolerance is required, and new semiconductor detector consisting of radiation-hard materials have been investigated. The Cu(In,Ga)Se2 (CIGS) semiconductor is expected to possess high radiation tolerance, with the ability to recover from radiation damage through the compensation of defects by ions. The CIGS has originally developed for a solar cell and its radiation tolerance was investigated for the usage in space. The CIGS, featuring a recovery capability, would shed new light to particle detector in high radiation environments. CIGS detectors (2 and 5 μm thick) were tested by Xe ion (400 MeV/u, 132Xe54+) at HIMAC, successfully detecting single Xe ion with a fast response. The output charge is understandable through estimation with the GEANT4 simulation. With 0.6 MGy irradiation by Xe ions, the CIGS output degraded to 50%, but it was recovered to 97% after the heat treatment under 130 ◦C for 2 hours. This marks a significant step in confirming that CIGS semiconductors can serve as particle detectors with recovery features for radiation damage.

権利情報:

  • In Copyright

    © 2024 IOP Publishing Ltd and Sissa Medialab

    This is an author-created, un-copyedited version of an article accepted for publication/published
    in Journal of Instrumentation. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or
    any version derived from it. The Version of Record is available online at https://doi.org/10.1088/1748-0221/19/05/c05042

キーワード: CIGS, Semiconductor detector, Particle physics

刊行年月日: 2024-05-01

出版者: IOP Publishing

掲載誌:

  • Journal of Instrumentation (ISSN: 17480221) vol. 19

研究助成金:

  • JSPS KAKENHI 21K18635
  • JSPS KAKENHI 23H01191

原稿種別: 著者最終稿 (Accepted manuscript)

MDR DOI: https://doi.org/10.48505/nims.4525

公開URL: https://doi.org/10.1088/1748-0221/19/05/c05042

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更新時刻: 2025-05-20 08:30:18 +0900

MDRでの公開時刻: 2025-05-20 08:19:01 +0900

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