Citation Formats

HARADA, Tomoko, TANUMA, Shigeo, OGIWARA, Toshiya. "Depth Profiling Analysis of InP/GaInAsP Multilayer Structure with Auger Electron Spectroscopy by Using Argon Ion Spot Beam". Journal of The Surface Science Society of Japan. 13, no. 10. . (1992): https://doi.org/10.1380/jsssj.13.10_595