OGIWARA, Toshiya, TANUMA, Shigeo.
"Auger Depth Profile Analysis of GaAs/AIAs Thin Film by Synthesized Spectrum Method Using Non-Negative Least Square Curve Fitting".
Journal of The Surface Science Society of Japan. 13, no. 10. .
(1992):
https://doi.org/10.1380/jsssj.13.10_606