Citation Formats

Ogiwara, Toshiya, Nagatomi, Takaharu, Tanuma, Shigeo, Kim, Kyung Joong. "Ultra High Depth Resolution Auger Depth Profiling by Both Electron and Ion Beams at the Glancing Incidence using an Inclined Specimen Holder". Journal of The Surface Science Society of Japan. 32, no. 10. . (2011): https://doi.org/10.1380/jsssj.32.664