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説明:

We present the first theoretical recipe for the clear and individual separation of surface, bulk and Begrenzungs effect components in surface electron energy spectra. The procedure ends up with the spectral contributions originated from surface and bulk-Begrenzungs excitations by using a simple method for dealing with the mixed scatterings. As an example, the model is applied to the reflection electron energy loss spectroscopy spectrum of Si. The electron spectroscopy techniques can directly use the present calculation schema to identify the origin of the electron signals from a sample. Our model provides the possibility for the detailed and accurate quantitative analysis of REELS spectra.

権利情報:

• Creative Commons BY Attribution 4.0 International
  Creative Commons BY Attribution 4.0 International

キーワード: reflection electron energy loss spectroscopy spectrum

刊行年月日: 2021-03-15

出版者: Springer Science and Business Media LLC

掲載誌:

• Scientific Reports (ISSN: 20452322) vol. 11 5954

研究助成金:

原稿種別: 出版者版 (Version of record)

MDR DOI:

公開URL: https://doi.org/10.1038/s41598-021-85429-6

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更新時刻: 2024-01-05 22:11:51 +0900

MDRでの公開時刻: 2023-02-28 10:58:46 +0900