key	value
@data_info@identifier@pid	spring8.83c5f777-7cc3-4776-9f3b-61bcd04c88c9
@data_info@identifier@register_name	/SPring-8/BL46XU/HAXPES_Standard/14_Si/n-type_Si_sub_Sputtered
@data_info@identifier@proposal_number	2019S0000
@data_info@date@create_time	2020-01-26 10:38:25
@data_info@date@update_time	2021-07-21 14:55:17
@data_info@facility	SPring-8
@data_info@class_name	BL46XU
@data_info@disk_name	HAXPES_Standard
@data_info@title_ja	標準試料
@data_info@title	Standard Sample
@data_info@access_rights	open
@data_info@license@name	CC BY-NC-SA 4.0
@data_info@data_depositor@name	Satoshi Yasuno
@data_info@data_depositor@affiliation@organization	JASRI
@data_info@contact_name@name	Industrial Application and Partnership Division
@data_info@contact_name@affiliation@organization	JASRI
@data_info@contact_name@role	organization
@sample_0@name	n-type_Si_sub_Sputtered
@sample_0@chemical_formula	Si
@sample_0@element_0@name	Si
@sample_0@element_0@suffix	1
@measurement@method@category	spectroscopy
@measurement@method@sub_category	HAXPES
@measurement@method@detection	Transmission
@measurement@incident_photon@energy	7938.9
@measurement@incident_photon@energy_unit	eV
@measurement@incident_photon@angle	10.0
@measurement@incident_photon@angle_unit	deg
@measurement@photoelectron@take_off_angle	80.0
@measurement@photoelectron@take_off_angle_unit	deg
@measurement@photoelectron@spectral_line_0@name	Si 1s
@measurement@photoelectron@spectral_line_1@name	Si 2s
@measurement@photoelectron@spectral_line_2@name	Si 2p
@measurement@photoelectron@energy_scale	Kinetic
@measurement@date@start_time	2018-10-17 02:49:33
@instrument@analyzer@pass_energy	200.0
@instrument@analyzer@pass_energy_unit	eV
@instrument@analyzer@dwell_time	200.0
@instrument@analyzer@dwell_time_unit	ms