# Fileset

[metadata.json](https://mdr.nims.go.jp/filesets/5965d3fc-c216-4754-93a5-12a3275b6500/download)

## Creator

[Masashi Ishii](https://orcid.org/0000-0003-0357-2832), SAGA-LS

## Rights

Creative Commons BY-NC-SA Attribution-NonCommercial-ShareAlike 4.0 International[Creative Commons BY-NC-SA Attribution-NonCommercial-ShareAlike 4.0 International](https://creativecommons.org/licenses/by-nc-sa/4.0/)

## Other metadata

[XAFS spectrum of Nickel(II) oxide](https://mdr.nims.go.jp/datasets/e3613acf-becc-46ad-9f38-cd6323f86322)

## Fulltext

{    "data_info": {        "data_depositor": {            "organization": "Kyushu Synchrotron Light Research Center",            "affiliation": "Beamline Group",            "name": "Kyushu Synchrotron Light Research Center",            "role": "Beamline staff"        },        "contact_name": {            "organization": "Kyushu Synchrotron Light Research Center",            "affiliation": "Beamline Group",            "name": "Kyushu Synchrotron Light Research Center",            "role": "Beamline staff"        },        "access_rights": "open",        "license": "CC-BY-NC-SA",        "deposite_time": {            "create_time": "2017-12",            "update_time": "2017-12"        },        "title": "NEXAFS spectrum of NiO",        "title_ja": "NiOのNEXAFSスペクトル",        "metadata_format": {            "version": "XAFS.20230203",            "schema_uri": "https://raw.githubusercontent.com/xafs-db/xafs-schema/main/draft/20230203/xafs-schema.json"        },        "measurement_methods": [            {                "category": "spectroscopy",                "sub_category": "XAFS"            }        ]    },    "facility": {        "name": "SAGA-LS",        "ring": {            "energy": 1.4,            "energy_unit": "GeV",            "filling_pattern": "100 bunchs with 26 blank bunchs"        },        "light_source": {            "type": "U",            "polarization": "Holizontal"        },        "beamline": "BL10"    },    "files": [        {            "file": [                {                    "name": "NiO_O-K"                }            ],            "description": "experimental",            "extension": "tey",            "headerlines": 1,            "columns": [                {                    "name": "E",                    "unit": "eV",                    "type": "processed",                    "detection": "photon energy",                    "additional_data": "Uncalibrated"                },                {                    "name": "Intensity (I/I0)",                    "type": "processed",                    "detection": "total electron yield"                }            ]        },        {            "file": [                {                    "name": "NiO.Thumb"                }            ],            "description": "thumbnail",            "extension": "png",            "format": "image/png"        }    ],    "instrument": {        "monochromator": {            "name": "varied line spacing plane grating 1200lines/mm"        }    },    "measurement": {        "edges": [            {                "element": "O",                "edge": "K-edge"            }        ]    },    "sample": {        "chemical_formula": "NiO",        "name": "nickel (Ⅱ) oxide",        "condition": {            "additional_data": "on carbon tape"        }    }}