# Fileset

[Supplementary Material_CoPt_20240310.pdf](https://mdr.nims.go.jp/filesets/3fbb76c3-5dc6-40d4-b1f0-0d55a8d54258/download)

## Creator

[Ryo Toyama](https://orcid.org/0000-0002-7398-5803), [Keisuke Masuda](https://orcid.org/0000-0002-6884-6390), [Kodchakorn Simalaotao](https://orcid.org/0000-0002-6098-4422), [Weinan Zhou](https://orcid.org/0000-0003-2946-9913), [Varun K Kushwaha](https://orcid.org/0000-0001-6344-4264), [Yuya Sakuraba](https://orcid.org/0000-0003-4618-9550)

## Rights

This is the Accepted Manuscript version of an article accepted for publication in Journal of Physics D: Applied Physics.  IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it.  The Version of Record is available online at https://dx.doi.org/10.1088/1361-6463/ad460e[Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International](https://creativecommons.org/licenses/by-nc-nd/4.0/)

## Other metadata

[Large anomalous Nernst conductivity of L1<sub>0</sub>-ordered CoPt in CoPt composition-spread thin films](https://mdr.nims.go.jp/datasets/93e98403-e6c9-42ba-80b3-9ebbc58ff9ef)

## Fulltext

1 Supplementary Material  Large anomalous Nernst conductivity of L10-ordered CoPt in CoPt composition-spread thin films  Ryo Toyama1,*, Keisuke Masuda1, Kodchakorn Simalaotao1,2, Weinan Zhou3, Varun K. Kushwaha1 and Yuya Sakuraba1,*  1 Research Center for Magnetic and Spintronic Materials (CMSM), National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan 2 Graduate School of Pure and Applied Sciences, University of Tsukuba, Tenodai 1-1-1, Tsukuba, Ibaraki 305-8571, Japan 3 International Center for Young Scientists (ICYS), National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan  E-mail: TOYAMA.Ryo@nims.go.jp and SAKURABA.Yuya@nims.go.jp    2  Figure S1. Two-dimensional (2D) x-ray diffraction (XRD) images and one-dimensional (1D) XRD patterns with χ = 40.191° of Co1–xPtx composition-spread thin films on MgO(100) substrates grown at room temperature (RT) for x = 0%, 1% and 13%. The diffraction peaks indicated by the symbol ＊ originated from electrical contact pads.    3  Figure S2. 2D XRD image and 1D XRD pattern with χ = 0° (out-of-plane) of nearly stoichiometric Co48Pt52 reference uniform film on MgO(100) substrate grown at RT, followed by post-annealing at 600 °C. The diffraction peaks indicated by the symbol ＊ originated from the MgO(100) substrate.