data_info:
  identifier:
    pid: spring8.83c5f777-7cc3-4776-9f3b-61bcd04c88c9
    register_name: /SPring-8/BL46XU/HAXPES_Standard/14_Si/n-type_Si_sub_Sputtered
    proposal_number: 2019S0000
  date:
    create_time: '2020-01-26 10:38:25'
    update_time: '2021-07-21 14:55:17'
  facility: SPring-8
  class_name: BL46XU
  disk_name: HAXPES_Standard
  title_ja: 標準試料
  title: Standard Sample
  access_rights: open
  license:
    name: CC BY-NC-SA 4.0
  data_depositor:
    name: Satoshi Yasuno
    affiliation:
      organization: JASRI
  contact_name:
    name: Industrial Application and Partnership Division
    affiliation:
      organization: JASRI
    role: organization
sample:
- name: n-type_Si_sub_Sputtered
  chemical_formula: Si
  element:
  - name: Si
    suffix: '1'
measurement:
  method:
    category: spectroscopy
    sub_category: HAXPES
    detection: Transmission
  incident_photon:
    energy: 7938.9
    energy_unit: eV
    angle: 10.0
    angle_unit: deg
  photoelectron:
    take_off_angle: 80.0
    take_off_angle_unit: deg
    spectral_line:
    - name: Si 1s
    - name: Si 2s
    - name: Si 2p
    energy_scale: Kinetic
  date:
    start_time: '2018-10-17 02:49:33'
instrument:
  analyzer:
    pass_energy: 200.0
    pass_energy_unit: eV
    dwell_time: 200.0
    dwell_time_unit: ms