Time-domain thermoreflectance technique using multiple delayed probe pulses for high-throughput data acquisition and analysis

ジャーナル論文

著者

Hiroto Arima (author) (この著者で検索)

National Institute of Advanced Industrial Science and Technology (AIST) National Metrology Institute of Japan (NMIJ)

Hiroto Arima ;

Yuichiro Yamashita (author) (この著者で検索)

Yuichiro Yamashita ;

Takashi Yagi (author) (この著者で検索)

Takashi Yagi

キーワード

Time-domain thermoreflectance, multiple delay, thin film, thermal effusivity, interfacial thermal resistance, machine learning

刊行年月日

2025-12-31

更新時刻

2025-07-16 16:14:58 +0900