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Defect Passivation of 2D Semiconductors by Fixating Chemisorbed Oxygen Molecules via h‐BN Encapsulations
- ジャーナル論文
- 著者
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;Jin‐Woo Jung (author) (この著者で検索);Hyeon‐Seo Choi (author) (この著者で検索);Young‐Jun Lee (author) (この著者で検索);Youngjae Kim (author) (この著者で検索)Takashi Taniguchi (author) (この著者で検索)National Institute for Materials Science
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Kenji Watanabe (author) (この著者で検索)National Institute for Materials Science
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;Min‐Yeong Choi (author) (この著者で検索);Jae Hyuck Jang (author) (この著者で検索);Hee‐Suk Chung (author) (この著者で検索);Dohun Kim (author) (この著者で検索);Youngwook Kim (author) (この著者で検索)Chang‐Hee Cho (author) (この著者で検索) - キーワード
- Hexagonal boron nitride, defect-related gap states, WS2 crystals
- 刊行年月日
- 2024-03-17
- 更新時刻
- 2025-02-14 12:32:08 +0900