Characterization of Interface States in CVD Monolayer MoS ₂ /Al ₂ O ₃ MOS Capacitors via the Conductance Method

ジャーナル論文

著者

Shiho Nakamura (author) (この著者で検索)

https://orcid.org/0009-0005-6326-7786 (unauthenticated)

Shiho Nakamura ;

Zaoyang Lin (author) (この著者で検索)

Zaoyang Lin ;

Daiki Tsuruoka (author) (この著者で検索)

Daiki Tsuruoka ;

Takahiko Endo (author) (この著者で検索)

Takahiko Endo ;

Xiao Yu (author) (この著者で検索)

https://orcid.org/0000-0001-8769-521X (unauthenticated)

Xiao Yu ;

Tsung-En Lee (author) (この著者で検索)

https://orcid.org/0000-0003-1881-3539 (unauthenticated)

Tsung-En Lee ;

Yasumitsu Miyata (author) (この著者で検索)

https://orcid.org/0000-0002-9733-5119 (unauthenticated)

Yasumitsu Miyata ;

Nobuyuki Aoki (author) (この著者で検索)

Nobuyuki Aoki ;

Mengnan Ke (author) (この著者で検索)

https://orcid.org/0000-0001-8235-9559 (unauthenticated)

Mengnan Ke

キーワード

MoS2 MOS Capacitors

刊行年月日

2026-07-03

更新時刻

2026-10-21 08:30:20 +0900