Keyword: thin film

4 records found.

Abstract_YenJu Wu.docx
Designing Thermal Insulating thin films with Data-Driven Innovation
Conference presentation
Creator
Yen-Ju Wu (author) (Search by this author)
Center for Basic Research on Materials/Data-driven Materials Research Field/Data-driven Inorganic Materials Group, National Institute for Materials Science
ORCID SAMURAI ;
Yibin Xu (author) (Search by this author)
Center for Basic Research on Materials/Data-driven Materials Research Field/Data-driven Inorganic Materials Group, National Institute for Materials Science
ORCID SAMURAI
Keyword
Interfacial thermal resistance, machine learning, thermal insulator, thin film
Date published
Updated at
2025-03-12 16:30:31 +0900

InSiO 2025.pdf
Oxygen-pressure driven balancing of interface and bulk scattering in amorphous oxide semiconductor thin-film transistors
Journal article
Creator
Che-Yi Lin (author) (Search by this author)
;
Yu-Ching Kuo (author) (Search by this author)
ORCID ;
I-Chen Liu (author) (Search by this author)
;
Feng-Shou Yang (author) (Search by this author)
;
Yuan-Ming Chang (author) (Search by this author)
;
Po-Wen Chiu (author) (Search by this author)
;
Toshihide Nabatame (author) (Search by this author)
;
Mengjiao Li (author) (Search by this author)
; ORCID SAMURAI ;
Yen-Fu Lin (author) (Search by this author)
ORCID
Keyword
Oxide, thin film, transistor
Date published
2025-09-05
Updated at
2025-09-26 17:46:31 +0900

Time-domain thermoreflectance technique using multiple delayed probe pulses for high-throughput data acquisition and analysis.pdf
Time-domain thermoreflectance technique using multiple delayed probe pulses for high-throughput data acquisition and analysis
Journal article
Creator
Hiroto Arima (author) (Search by this author)
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST)
;
Yuichiro Yamashita (author) (Search by this author)
;
Takashi Yagi (author) (Search by this author)
Keyword
Time-domain thermoreflectance, multiple delay, thin film, thermal effusivity, interfacial thermal resistance, machine learning
Date published
2025-12-31
Updated at
2025-07-16 16:14:58 +0900

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