Nanoscale Origin of Strong Charge Carrier Scattering at Grain Boundaries in Orthorhombic SnSe Semiconductor Thin Films
- ジャーナル論文
- 著者
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;Xinyi He (author) (この著者で検索);Kenji Matsuo (author) (この著者で検索)Takayoshi Katase (author) (この著者で検索)
https://orcid.org/0000-0002-2593-7487
(unauthenticated)
;
Kota Hanzawa (author) (この著者で検索)
https://orcid.org/0000-0002-0995-9360
(unauthenticated)
;
;Hideto Yoshida (author) (この著者で検索)Shigenori Ueda (author) (この著者で検索)
;
Hidenori Hiramatsu (author) (この著者で検索)
https://orcid.org/0000-0002-5664-5831
(unauthenticated)
;
Hideo Hosono (author) (この著者で検索)
;
Toshio Kamiya (author) (この著者で検索) - キーワード
- tin selenide, thermoelectric material, epitaxial film, carrier transport, defect, density functional theory
- 刊行年月日
- 2025-04-25
- 更新時刻
- 2025-05-15 08:38:54 +0900
Characterization of wide-gap semiconductors by photothermal deflection spectroscopy
- ジャーナル論文
- 著者
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Masatomo Sumiya (author) (この著者で検索)National Institute for Materials Science
- キーワード
- III-V nitride semiconductor, photothermal deflection spectroscopy, defect
- 刊行年月日
- 2023-11-01
- 更新時刻
- 2024-12-10 16:56:31 +0900