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論文・データセット
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ジャーナル論文(2)
キーワード
Device stability (2)
Capacitance spectroscopy, (1)
Interfacial deterioration (1)
Iodine migration (1)
Lead-free (1)
Nickel oxide (1)
Pb-free Tandem device (1)
Perovskite degradation (1)
Surface passivation (1)
Tin oxidation (1)
(more)
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キーワード: Device stability
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2 件のレコードが見つかりました。
Ameliorating Defects in Wide Bandgap Tin Perovskite Solar Cells Using Fluorinated Solvent and Hydrazide
ジャーナル論文
著者
Dhruba B. Khadka
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9134-3890
NIMS Researchers Directory SAMURAI
Dhruba B. Khadka
;
Yasuhiro Shirai
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2164-5468
NIMS Researchers Directory SAMURAI
Yasuhiro Shirai
;
Ryoji Sahara
(author) (
この著者で検索
)
https://orcid.org/0000-0003-0788-2985
NIMS Researchers Directory SAMURAI
Ryoji Sahara
;
Masatoshi Yanagida
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8065-7875
NIMS Researchers Directory SAMURAI
Masatoshi Yanagida
;
Kenjiro Miyano
(author) (
この著者で検索
)
Kenjiro Miyano
キーワード
Wide bandgap tin perovskite
,
Lead-free
,
Tin oxidation
,
Device stability
,
Surface passivation
,
Pb-free Tandem device
刊行年月日
2024-12-15
更新時刻
2025-12-19 08:31:22 +0900
Insights into Accelerated Degradation of Perovskite Solar Cells under Continuous Illumination Driven by Thermal Stress and Interfacial Junction
ジャーナル論文
著者
Dhruba B. Khadka
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9134-3890
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Dhruba B. Khadka
;
Yasuhiro Shirai
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2164-5468
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Yasuhiro Shirai
;
Masatoshi Yanagida
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8065-7875
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Masatoshi Yanagida
;
Kenjiro Miyano
(author) (
この著者で検索
)
https://orcid.org/0000-0002-5869-3087
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kenjiro Miyano
キーワード
Device stability
,
Iodine migration
,
Nickel oxide
,
Interfacial deterioration
,
columnar inter-grains
,
Capacitance spectroscopy,
,
Perovskite degradation
刊行年月日
2021-10-25
更新時刻
2024-11-29 16:31:03 +0900
キーワード
Device stability
(2)
Capacitance spectroscopy,
(1)
Interfacial deterioration
(1)
Iodine migration
(1)
Lead-free
(1)
Nickel oxide
(1)
Pb-free Tandem device
(1)
Perovskite degradation
(1)
Surface passivation
(1)
Tin oxidation
(1)
Wide bandgap tin perovskite
(1)
columnar inter-grains
(1)
RDEメタデータ定義
RDE送り状
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