2 件のレコードが見つかりました。
Experimental investigation and simulation of SEM image intensity behaviors for developing thickness-controlled S/TEM lamella preparation via FIB-SEM
- ジャーナル論文
- 著者
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Jun Uzuhashi (author) (この著者で検索)
;
;Yuanzhao Yao (author) (この著者で検索)Tadakatsu Ohkubo (author) (この著者で検索)
;
Takashi Sekiguchi (author) (この著者で検索) - キーワード
- transmission electron microscopy, scanning electron microscopy, focused ion beam
- 刊行年月日
- 2025-08-01
- 更新時刻
- 2026-01-31 16:30:04 +0900
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM
- ジャーナル論文
- 著者
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Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
Kazuhiro Hono (author) (この著者で検索)National Institute for Materials Science
- キーワード
- atom probe tomography, focused ion beam, scanning electron microscopy, automation
- 刊行年月日
- 2023-02-19
- 更新時刻
- 2025-02-23 22:51:16 +0900