4 件のレコードが見つかりました。
Nonnegative matrix factorization incorporating domain specific constraints for four dimensional scanning transmission electron microscopy
- ジャーナル論文
- 著者
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Koji Kimoto (author) (この著者で検索)
;
Fumihiko Uesugi (author) (この著者で検索)
;
Koji Harano (author) (この著者で検索)
;
Jun Kikkawa (author) (この著者で検索)
;
Ovidiu Cretu (author) (この著者で検索)
;
Yuki Shibazaki (author) (この著者で検索)
https://orcid.org/0000-0002-0550-6719
(unauthenticated)
;
Motoki Shiga (author) (この著者で検索)
;
Atsushi Togo (author) (この著者で検索)
- キーワード
- 4D-STEM, unsupervised machine learning, nonnegative matrix factorization, scanning transmission electron microscopy, metallic glass, amorphous, ZrCuAl
- 刊行年月日
- 2025-11-07
- 更新時刻
- 2025-12-01 12:30:04 +0900
Unveiling Twist Domains in Monolayer MoS2 through 4D‐STEM and Unsupervised Machine Learning
- ジャーナル論文
- 著者
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Koji Kimoto (author) (この著者で検索)
;
Ovidiu Cretu (author) (この著者で検索)
;
Koji Harano (author) (この著者で検索)
;
Fumihiko Uesugi (author) (この著者で検索)
;
Jun Kikkawa (author) (この著者で検索)
;
Kohei Aso (author) (この著者で検索)
https://orcid.org/0000-0001-6935-7655
(unauthenticated)
;
Yoshifumi Oshima (author) (この著者で検索)
https://orcid.org/0000-0003-1898-0142
(unauthenticated)
;
Takashi Matsumoto (author) (この著者で検索)
https://orcid.org/0009-0007-7418-6724
(unauthenticated)
;
Yoshiki Sakuma (author) (この著者で検索)
- キーワード
- 4D-STEM, dichalcogenide, metal–organic chemical vapor deposition, MoS2,, scanning transmission electron microscopy, unsupervised machine learning
- 刊行年月日
- 2025-08-06
- 更新時刻
- 2025-08-27 12:30:17 +0900
Structure-dynamics relation in metallic glass revealed by 5-dimensional scanning transmission electron microscopy
- ジャーナル論文
- 著者
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Katsuaki Nakazawa (author) (この著者で検索)National Institute for Materials Science
;
Kazutaka Mitsuishi (author) (この著者で検索)National Institute for Materials Science
;
;Konstantin Iakoubovskii (author) (この著者で検索)Shinji Kohara (author) (この著者で検索)National Institute for Materials Science
;
Koichi Tsuchiya (author) (この著者で検索)National Institute for Materials Science
- キーワード
- 5D-STEM, 4D-STEM, diffraction, glass
- 刊行年月日
- 2024-11-15
- 更新時刻
- 2024-11-20 18:40:10 +0900
Local defect and mid-gap state analysis of GaN using monochromated EELS combined with nanodiffraction and atomic-resolution imaging
- ジャーナル論文
- 著者
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Shunsuke Yamashita (author) (この著者で検索)
https://orcid.org/0000-0003-1702-1708
(unauthenticated)
;
;Sei Fukushima (author) (この著者で検索)Jun Kikkawa (author) (この著者で検索)National Institute for Materials Science (NIMS) Center for Basic Research on Materials
;
;Ryoji Arai (author) (この著者で検索)Yuya Kanitani (author) (この著者で検索)
https://orcid.org/0009-0002-2154-5571
(unauthenticated)
;
Koji Kimoto (author) (この著者で検索)National Institute for Materials Science (NIMS) Center for Basic Research on Materials
;
Yoshihiro Kudo (author) (この著者で検索)
- キーワード
- defect, GaN, EELS, 4D-STEM, HAADF-STEM, ABF-STEM, HAXPES
- 刊行年月日
- 2024-03-01
- 更新時刻
- 2024-03-19 16:56:29 +0900