キーワード: scanning transmission electron microscopy

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Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing.pdf
Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing
論文
著者
Jun Uzuhashi SAMURAI ORCID ; Jun Chen SAMURAI ORCID ; Ashutosh Kumar ORCID ; Wei Yi ORCID ; Tadakatsu Ohkubo SAMURAI ORCID ; Ryo Tanaka ; Shinya Takashima ; Masaharu Edo ; Kacper Sierakowski ; Michal Bockowski ; Hideki Sakurai ; Tetsu Kachi ; Takashi Sekiguchi ORCID ; Kazuhiro Hono SAMURAI ORCID
キーワード
gallium nitride, implantation, atom probe tomography, cathodoluminescence, scanning transmission electron microscopy
刊行年月日
2022-05-14
更新時刻
2024-01-05 22:11:22 +0900