Determining the Electron Scattering from Interfacial Coulomb Scatterers in Two-Dimensional Transistors

論文

著者

Yi-Te Lee ; Yu-Ting Huang ; Shao-Pin Chiu ; Ruey-Tay Wang ; Takashi Taniguchi ; Kenji Watanabe ; Raman Sankar ; Chi-Te Liang ; Wei-Hua Wang ; Sheng-Shiuan Yeh ; Juhn-Jong Lin

キーワード

electron scattering, 2D materials, Coulomb scattering strength, low-frequency noise, indium selenide, interfacial Coulomb scatterers, 2D transist

刊行年月日

2024-01-10

更新時刻

2025-10-14 17:51:17 +0900