Bayesian estimation analysis of X-ray photoelectron spectra: Application to Si 2p spectrum analysis of oxidized silicon surfaces

論文

著者

Hiroshi Shinotsuka ; Kenji Nagata ; Hideki Yoshikawa ; Shuichi Ogawa ; Akitaka Yoshigoe

キーワード

Bayesian estimation, X-ray photoelectron spectroscopy, Statistical analysis, Silicon surface oxidation

刊行年月日

2024-12-03

更新時刻

2025-01-21 12:30:34 +0900