2 件のレコードが見つかりました。
Spectroscopic studies of atomic defects and bandgap renormalization in semiconducting monolayer transition metal dichalcogenides
- ジャーナル論文
- 著者
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;Tae Young Jeong (author) (この著者で検索);Hakseong Kim (author) (この著者で検索);Sang-Jun Choi (author) (この著者で検索)Kenji Watanabe (author) (この著者で検索)National Institute for Materials Science
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Takashi Taniguchi (author) (この著者で検索)National Institute for Materials Science
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;Ki Ju Yee (author) (この著者で検索);Yong-Sung Kim (author) (この著者で検索)Suyong Jung (author) (この著者で検索) - キーワード
- Atomic defect states, transition metal dichalcogenides, electron tunneling
- 刊行年月日
- 2019-08-23
- 更新時刻
- 2025-02-23 22:49:52 +0900
Thickness Mapping and Layer Number Identification of Exfoliated van der Waals Materials by Fourier Imaging Micro-Ellipsometry
- ジャーナル論文
- 著者
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;Ralfy Kenaz (author) (この著者で検索);Saptarshi Ghosh (author) (この著者で検索);Pradheesh Ramachandran (author) (この著者で検索)Kenji Watanabe (author) (この著者で検索)National Institute for Materials Science
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Takashi Taniguchi (author) (この著者で検索)National Institute for Materials Science
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;Hadar Steinberg (author) (この著者で検索)Ronen Rapaport (author) (この著者で検索)
- キーワード
- Spectroscopic ellipsometry, thickness mapping, transition metal dichalcogenides
- 刊行年月日
- 2023-05-23
- 更新時刻
- 2025-02-14 12:30:58 +0900