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論文(8)
プロシーディングス(1)
キーワード
gallium nitride (9)
atom probe tomography (5)
transmission electron microscopy (4)
cathodoluminescence (2)
scanning transmission electron microscopy (2)
FNO (1)
GaN (1)
HAXPES (1)
activation (1)
defect passivation (1)
(more)
ライセンス
Creative Commons BY Attribution 4.0 International (4)
In Copyright (3)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (1)
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International (1)
ファイル種別
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9 件のレコードが見つかりました。
Effects of nitrosyl fluoride based gas treatment on fluorination and redox reaction at GaN surface and Pt/GaN interface
論文
著者
Takahiro Nagata
;
Asahiko Matsuda
;
Takashi Teramoto
;
Dominic Gerlach
;
Peng Shen
;
Shigenori Ueda
;
Takako Kimura
;
Christian Dussarrat
;
Toyohiro Chikyow
キーワード
gallium nitride
,
GaN
,
nitrosyl fluoride
,
FNO
,
HAXPES
,
defect passivation
,
fluorination
刊行年月日
2025-03-07
更新時刻
2025-03-18 17:22:28 +0900
Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution in Mg Ion‐Implanted GaN
論文
著者
Emi Kano
;
Jun Uzuhashi
; Koki Kobayashi ; Kosuke Ishikawa ; Kyosuke Sawabe ; Tetsuo Narita ; Kacper Sierakowski ; Michal Bockowski ;
Tadakatsu Ohkubo
; Tetsu Kachi ;
Nobuyuki Ikarashi
キーワード
gallium nitride
,
atom probe tomography
,
transmission electron microscopy
刊行年月日
2024-04-22
更新時刻
2024-09-20 16:30:27 +0900
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer
論文
著者
Jun Uzuhashi
;
Jun Chen
; Ryo Tanaka ; Shinya Takashima ; Masaharu Edo ;
Tadakatsu Ohkubo
; Takashi Sekiguchi
キーワード
gallium nitride
,
atom probe tomography
,
transmission electron microscopy
,
cathodoluminescence
刊行年月日
2024-08-07
更新時刻
2024-08-03 08:30:15 +0900
Vacancy‐Type Defects and Their Trapping/Detrapping of Charge Carriers in Ion‐Implanted GaN Studied by Positron Annihilation
論文
著者
Akira Uedono
;
Ryo Tanaka
;
Shinya Takashima
; Katsunori Ueno ; Masaharu Edo ;
Kohei Shima
;
Shigefusa F. Chichibu
;
Jun Uzuhashi
;
Tadakatsu Ohkubo
;
Shoji Ishibashi
;
Kacper Sierakowski
;
Michal Bockowski
キーワード
gallium nitride
刊行年月日
2024-02-29
更新時刻
2025-03-01 12:30:45 +0900
Development of p-type Ion Implantation Technique for Realization of GaN Vertical MOSFETs
プロシーディングス
著者
Ryo Tanaka ; Shinya Takashima ; Katsunori Ueno ; Masahiro Horita ; Jun Suda ;
Jun Uzuhashi
;
Tadakatsu Ohkubo
; Masaharu Edo
キーワード
gallium nitride
,
atom probe tomography
,
transmission electron microscopy
刊行年月日
2023-06-08
更新時刻
2024-04-19 12:30:23 +0900
Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation
論文
著者
Emi Kano ; Keita Kataoka ;
Jun Uzuhashi
; Kenta Chokawa ; Hideki Sakurai ; Akira Uedono ; Tetsuo Narita ; Kacper Sierakowski ; Michal Bockowski ; Ritsuo Otsuki ; Koki Kobayashi ; Yuta Itoh ; Masahiro Nagao ;
Tadakatsu Ohkubo
;
Kazuhiro Hono
; Jun Suda ; Tetsu Kachi ; Nobuyuki Ikarashi
キーワード
gallium nitride
,
transmission electron microscopy
,
atom probe tomography
刊行年月日
2022-08-14
更新時刻
2024-01-05 22:13:58 +0900
Annealing properties of vacancy-type defects in ion implanted GaN during ultra-high-pressure annealing studied by using a monoenergetic positron beam
論文
著者
Akira Uedono ; Hideki Sakurai ;
Jun Uzuhashi
; Tetsuo Narita ; Kacper Sierakowski ; Shoji Ishibashi ; Shigefusa F. Chichibu ; Michal Bockowski ; Jun Suda ; Tadakatsu Ohokubo ; Nobuyuki Ikarashi ;
Kazuhiro Hono
; Tetsu Kachi
キーワード
gallium nitride
,
vacancy
,
positron
刊行年月日
2023-03-15
更新時刻
2024-01-05 22:12:35 +0900
Acceptor activation of Mg-doped GaN—Effects of N2/O2 vs N2 as ambient gas during annealing
論文
著者
Ashutosh Kumar
; Martin Berg ; Qin Wang ;
Jun Uzuhashi
;
Tadakatsu Ohkubo
; Michael Salter ; Peter Ramvall
キーワード
gallium nitride
,
scanning transmission electron microscopy
,
semiconductor
,
activation
刊行年月日
2023-07-21
更新時刻
2024-01-05 22:12:15 +0900
Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing
論文
著者
Jun Uzuhashi
;
Jun Chen
;
Ashutosh Kumar
;
Wei Yi
;
Tadakatsu Ohkubo
; Ryo Tanaka ; Shinya Takashima ; Masaharu Edo ; Kacper Sierakowski ; Michal Bockowski ; Hideki Sakurai ; Tetsu Kachi ;
Takashi Sekiguchi
;
Kazuhiro Hono
キーワード
gallium nitride
,
implantation
,
atom probe tomography
,
cathodoluminescence
,
scanning transmission electron microscopy
刊行年月日
2022-05-14
更新時刻
2024-01-05 22:11:22 +0900
キーワード
gallium nitride
(9)
atom probe tomography
(5)
transmission electron microscopy
(4)
cathodoluminescence
(2)
scanning transmission electron microscopy
(2)
FNO
(1)
GaN
(1)
HAXPES
(1)
activation
(1)
defect passivation
(1)
fluorination
(1)
implantation
(1)
nitrosyl fluoride
(1)
positron
(1)
semiconductor
(1)
vacancy
(1)
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