Thickness Mapping and Layer Number Identification of Exfoliated van der Waals Materials by Fourier Imaging Micro-Ellipsometry

Article

Creator

Ralfy Kenaz ; Saptarshi Ghosh ; Pradheesh Ramachandran ; Kenji Watanabe ; Takashi Taniguchi ; Hadar Steinberg ; Ronen Rapaport

Keyword

Spectroscopic ellipsometry, thickness mapping, transition metal dichalcogenides

Date published

2023-05-23

Updated at

2025-02-14 12:30:58 +0900