Quantitative Characterization by Transmission Electron Microscopy and Its Application to Interfacial Phenomena in Crystalline Materials

Article

Creator

Seiichiro Ii

Keyword

transmission electron microscopy, energy dispersive X-ray spectroscopy, electron energy loss spectroscopy, grain boundary, interphase boundary

Date published

2024-01-25

Updated at

2024-04-02 16:30:27 +0900