Fabrication and characterization of single-crystalline CoSn(10-10) kagome metal thin films for interconnect applications: structure and anisotropic electrical resistivity

Article

Creator

Tomoya Nakatani ; Nattamon Suwannaharn ; Taisuke T. Sasaki

Keyword

interconnect, semiconductor, kagome, epitaxial, resistivity

Date published

2025-11-17

Updated at

2025-12-11 12:30:21 +0900