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in situ electron microscopy (2)
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Keyword: in situ electron microscopy
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[Research Highlights Vol.77] New TEM Technique Creates 2.8nm Transistor
Magazine
Collection
Research Highlights
Creator
International Center for Materials Nanoarchitectonics (WPI-MANA)
Keyword
carbon nanotube
,
molecular junction
,
chirality
,
transistor
,
metal-semiconductor transition
,
quantum transport
,
in situ electron microscopy
,
one dimensional materials
,
graphene
,
gold probes
Date published
2022-07-26
Updated at
2023-12-26 21:34:23 +0900
[Research Highlights Vol.15] Revealing the "Scotch-tape" technique mechanism
Magazine
Collection
Research Highlights
Creator
International Center for Materials Nanoarchitectonics (WPI-MANA)
Keyword
in situ electron microscopy
,
nanomechanics
,
mechanical cleavage
,
atomic layers
,
molybdenum disulphide (MoS2)
,
2D materials
Date published
2014-06-27
Updated at
2023-12-26 21:20:15 +0900
Keyword
in situ electron microscopy
(2)
2D materials
(1)
atomic layers
(1)
carbon nanotube
(1)
chirality
(1)
gold probes
(1)
graphene
(1)
mechanical cleavage
(1)
metal-semiconductor transition
(1)
molecular junction
(1)
molybdenum disulphide (MoS2)
(1)
nanomechanics
(1)
one dimensional materials
(1)
quantum transport
(1)
transistor
(1)
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