Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering

Article

Creator

Hiroo Tajiri ; Shinji Kohara ; Koji Kimura ; Sekhar Halubai ; Haruto Morimoto ; Naohisa Happo ; Jens R. Stellhorn ; Yohei Onodera ; Xvsheng Qiao ; Daisuke Urushihara ; Peidong Hu ; Toru Wakihara ; Toyohiko Kinoshita ; Koichi Hayashi

Keyword

X-ray diffractometers, element-specific measurements, X-ray fluorescence holography, anomalous X-ray scattering

Date published

2025-01-01

Updated at

2024-12-26 16:30:51 +0900