Evaluation of defect density in bulk gallium nitrides by photothermal deflection spectroscopy and steady-state photocapacitance methods

Journal article

Creator

Masatomo Sumiya (author) (Search by this author)

https://orcid.org/0000-0003-0960-3812

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Masatomo Sumiya ;

Hajime Fujikura (author) (Search by this author)

Hajime Fujikura ;

Yoshitaka Nakano (author) (Search by this author)

Yoshitaka Nakano ;

Shuhei Yashiro (author) (Search by this author)

Shuhei Yashiro ;

Yasuo Koide (author) (Search by this author)

https://orcid.org/0000-0001-8321-9822

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Yasuo Koide ;

Tohru Honda (author) (Search by this author)

Tohru Honda

Keyword

GaN bulk, defect level, photothermal deflection spectroscopy

Date published

2024-04-06

Updated at

2024-08-26 13:22:37 +0900