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atomic force microscopy; (1)
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Keyword: atomic force microscopy;
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Exploring partially reduced CeO 2(111) surface at the atomic scale using scanning probe microscopy
Article
Creator
Kyungmin Kim
;
Masayuki Abe
;
Shigeki Kawai
;
Oscar Custance
Keyword
Metal oxide surface
,
ceria
,
scanning tunneling microscopy
,
atomic force microscopy;
,
force spectroscopy
,
Ce3+
Date published
2025-12-31
Updated at
2025-08-19 12:30:24 +0900
Keyword
Ce3+
(1)
Metal oxide surface
(1)
atomic force microscopy;
(1)
ceria
(1)
force spectroscopy
(1)
scanning tunneling microscopy
(1)
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