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Resource type
Journal article(2)
Keyword
adhesion (2)
X-ray nanobeam diffraction (1)
atomic layer deposition (1)
buried interface (1)
deformation and fracture processes (1)
electromechanical properties (1)
flexible substrates (1)
polyrotaxane (1)
strain delocalization (1)
strain-distribution analysis (1)
(more)
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In Copyright (2)
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application/pdf (2)
Keyword: adhesion
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2 records found.
Atomic Layer-Deposited Interlayers for Robust Metal–Polymer Interfaces
Journal article
Creator
Johanna Byloff
(author) (
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https://orcid.org/0000-0001-6026-6845
(unauthenticated)
Johanna Byloff
;
Claus Othmar Wolfgang Trost
(author) (
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)
https://orcid.org/0000-0002-7570-688X
(unauthenticated)
Claus Othmar Wolfgang Trost
;
Vivek Devulapalli
(author) (
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)
Vivek Devulapalli
;
Shuhel Altaf Husain
(author) (
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)
Shuhel Altaf Husain
;
Damien Faurie
(author) (
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)
https://orcid.org/0000-0001-7259-3958
(unauthenticated)
Damien Faurie
;
Pierre-Olivier Renault
(author) (
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)
Pierre-Olivier Renault
;
Thomas Edward James Edwards
(author) (
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)
https://orcid.org/0000-0002-3089-0062
NIMS Researchers Directory SAMURAI
Thomas Edward James Edwards
;
Megan J. Cordill
(author) (
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)
https://orcid.org/0000-0003-1142-8312
(unauthenticated)
Megan J. Cordill
;
Daniele Casari
(author) (
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)
https://orcid.org/0000-0003-2113-5070
(unauthenticated)
Daniele Casari
;
Barbara Putz
(author) (
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)
Barbara Putz
Keyword
thin films
,
electromechanical properties
,
atomic layer deposition
,
flexible substrates
,
tensile testing
,
adhesion
Date published
2025-07-16
Updated at
2025-08-22 09:46:25 +0900
In Situ Analysis of Local Strain Distribution of Amorphous Polyrotaxane Adhesives Constrained by Metal Substrates
Journal article
Creator
Kazuaki Kato
(author) (
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)
https://orcid.org/0000-0002-9997-8599
(unauthenticated)
National Institute for Materials Science
Kazuaki Kato
;
Ayumu Takeshima
(author) (
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)
Ayumu Takeshima
;
Kenichiro Ryu
(author) (
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)
Kenichiro Ryu
;
Kohzo Ito
(author) (
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)
Kohzo Ito
;
Masanobu Naito
(author) (
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)
https://orcid.org/0000-0001-7198-819X
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Masanobu Naito
;
Yoshiki Kohmura
(author) (
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)
Yoshiki Kohmura
;
Taiki Hoshino
(author) (
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)
Taiki Hoshino
Keyword
adhesion
,
buried interface
,
X-ray nanobeam diffraction
,
strain-distribution analysis
,
deformation and fracture processes
,
polyrotaxane
,
strain delocalization
Date published
2024-06-13
Updated at
2025-06-19 08:30:18 +0900
Keyword
adhesion
(2)
X-ray nanobeam diffraction
(1)
atomic layer deposition
(1)
buried interface
(1)
deformation and fracture processes
(1)
electromechanical properties
(1)
flexible substrates
(1)
polyrotaxane
(1)
strain delocalization
(1)
strain-distribution analysis
(1)
tensile testing
(1)
thin films
(1)
RDE metadata def
RDE invoice schema
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