Structural analysis of Si-doped amorphous In2O3 based on quantum beam measurements and computer simulations

Article

Creator

Yuta Shuseki ; Akihiko Fujiwara ; Nobuhiko Mitoma ; Takio Kizu ; Toshihide Nabatame ; Kazuhito Tsukagoshi ; Yohei Onodera ; Atsunobu Masuno ; Koji Ohara ; Shinji Kohara

Keyword

Amorphous indium oxide,, X-ray diffraction, Molecular dynamics simulation, Reverse Monte Carlo, Topological analysis, Thermal stability

Date published

2025-10-21

Updated at

2025-10-24 08:30:19 +0900