Keyword: Statistical analysis

2 records found.

Shinotsuka2024_ApplSurfSci685_162001.pdf
Bayesian estimation analysis of X-ray photoelectron spectra: Application to Si 2p spectrum analysis of oxidized silicon surfaces
Journal article
Creator
Hiroshi Shinotsuka (author) (Search by this author)
ORCID SAMURAI ;
Kenji Nagata (author) (Search by this author)
ORCID SAMURAI ;
Hideki Yoshikawa (author) (Search by this author)
ORCID SAMURAI ;
Shuichi Ogawa (author) (Search by this author)
;
Akitaka Yoshigoe (author) (Search by this author)
Keyword
Bayesian estimation, X-ray photoelectron spectroscopy, Statistical analysis, Silicon surface oxidation
Date published
2024-12-03
Updated at
2025-01-21 12:30:34 +0900