Local defect and mid-gap state analysis of GaN using monochromated EELS combined with nanodiffraction and atomic-resolution imaging

Article

Creator

Shunsuke Yamashita ; Sei Fukushima ; Jun Kikkawa ; Ryoji Arai ; Yuya Kanitani ; Koji Kimoto ; Yoshihiro Kudo

Keyword

defect, GaN, EELS, 4D-STEM, HAADF-STEM, ABF-STEM, HAXPES

Date published

2024-03-01

Updated at

2024-03-19 16:56:29 +0900