Electron trapping/detrapping at oxygen vacancies and imprint evolution in La-doped Hf0.5Zr0.5O2 ferroelectric capacitors probed by hard x-ray photoelectron spectroscopy

Journal article

Creator

W. Hamouda (author) (Search by this author)

https://orcid.org/0000-0002-7055-7264 (unauthenticated)

W. Hamouda ;

Y. Yamashita (author) (Search by this author)

https://orcid.org/0000-0003-0994-8095

NIMS Researchers Directory SAMURAI

Y. Yamashita ;

S. Ueda (author) (Search by this author)

https://orcid.org/0000-0001-9425-0614

NIMS Researchers Directory SAMURAI

S. Ueda ;

S. Matzen (author) (Search by this author)

https://orcid.org/0000-0002-4244-6516 (unauthenticated)

S. Matzen ;

O. Renault (author) (Search by this author)

https://orcid.org/0000-0002-0683-9590 (unauthenticated)

O. Renault ;

F. Mehmood (author) (Search by this author)

https://orcid.org/0000-0002-9530-380X (unauthenticated)

F. Mehmood ;

T. Mikolajick (author) (Search by this author)

https://orcid.org/0000-0003-3814-0378 (unauthenticated)

T. Mikolajick ;

U. Schroeder (author) (Search by this author)

https://orcid.org/0000-0002-6824-2386 (unauthenticated)

U. Schroeder ;

N. Barrett (author) (Search by this author)

https://orcid.org/0000-0002-8228-0805 (unauthenticated)

N. Barrett

Keyword

Hf0.5Zr0.5O2, HAXPES, operando

Date published

2025-11-03

Updated at

2025-11-13 12:30:12 +0900