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Resource type: Journal article Keyword: surface analysis
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Figures.pdf
Calculation of Electron Inelastic Mean Free Paths (IMFPs). VII. Reliability of the TPP-2M IMFP Predictive Equation
Journal article
Creator
Tanuma, Shigeo (author) (Search by this author)
ORCID https://orcid.org/0000-0003-2628-9941
SAMURAI NIMS Researchers Directory SAMURAI
ORCID SAMURAI ;
Powell, C. J. (author) (Search by this author)
ORCID https://orcid.org/0000-0001-8990-2286 (unauthenticated)
ORCID ;
Penn, D. R. (author) (Search by this author)
Keyword
IMFP, TPP-2M, number of valence electrons, elemental solids, XPS, electron inelastic mean free paths, surface sensitivity, IMFPs, AES, surface analysis
Date published
2003-02-11
Updated at
2022-10-03 01:54:38 +0900

Keyword
  • AES (1)
  • IMFP (1)
  • IMFPs (1)
  • TPP-2M (1)
  • XPS (1)
  • electron inelastic mean free paths (1)
  • elemental solids (1)
  • number of valence electrons (1)
  • surface analysis (1)
  • surface sensitivity (1)
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