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Article and Dataset
Collection
Resource type
Journal article(3)
Dataset(2)
Keyword
XPS (5)
GaN (2)
Gallium nitride (2)
Oxidation (2)
SPring-8 (2)
AES (1)
Adsorption (1)
Auger electron spectroscopy (1)
Band bending (1)
ISO (1)
(more)
License
Creative Commons BY Attribution 4.0 International (3)
In Copyright (2)
File type
application/pdf (3)
application/zip (2)
image/jpeg (2)
Measurement method
x-ray photoelectron spectroscopy (2)
Instrument name
BL23_XPS (2)
Model number
(2)
Keyword: XPS
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Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
Journal article
Creator
TANUMA, Shigeo
(author) (
Search by this author
)
https://orcid.org/0000-0003-2628-9941
NIMS Researchers Directory SAMURAI
TANUMA, Shigeo
Keyword
XPS
,
quantitative surface analysis
,
X-ray photoelectron spectroscopy
,
Auger electron spectroscopy
,
relative sensitivity factor
,
ISO
,
International Organization for Standardization
,
AES
Date published
2005-12-28
Updated at
2024-01-05 22:11:34 +0900
Origin of two-dimensional MXene/ferromagnetic interface evaluated by angle-dependent hard X-ray photoemission spectroscopy
Journal article
Creator
Prabhat Kumar
(author) (
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)
https://orcid.org/0000-0003-3897-193X
(unauthenticated)
Prabhat Kumar
;
Shunsuke Tsuda
(author) (
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)
https://orcid.org/0000-0001-6209-8048
NIMS Researchers Directory SAMURAI
Shunsuke Tsuda
;
Koichiro Yaji
(author) (
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)
https://orcid.org/0000-0002-0721-1316
NIMS Researchers Directory SAMURAI
Koichiro Yaji
;
Shinji Isogami
(author) (
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)
https://orcid.org/0000-0001-7230-6090
NIMS Researchers Directory SAMURAI
Shinji Isogami
Keyword
MXene
,
Interface
,
XPS
Date published
2025-12-31
Updated at
2025-09-16 12:30:22 +0900
Continuous real-time O 1s core XPS spectra of initial O
2
molecule adsorption on polar and m-plane surfaces of GaN
Dataset
Creator
SUMIYA, Masatomo
(author) (
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)
https://orcid.org/0000-0003-0960-3812
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
SUMIYA, Masatomo
Keyword
GaN
,
Gallium nitride
,
Oxidation
,
Adsorption
,
XPS
,
SPring-8
Date published
2020-11-19
Updated at
2024-01-05 22:13:22 +0900
Calibration of binding energy and clarification of interfacial band bending for the Al2O3/diamond heterojunction
Journal article
Creator
J. W. Liu
(author) (
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)
https://orcid.org/0000-0003-2580-7401
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
J. W. Liu
;
T. Teraji
(author) (
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)
https://orcid.org/0000-0002-7731-0547
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
T. Teraji
;
B. Da
(author) (
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)
https://orcid.org/0000-0002-0785-8662
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
B. Da
;
Y. Koide
(author) (
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)
https://orcid.org/0000-0001-8321-9822
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Y. Koide
Keyword
binding energy calibration
,
carbon-related materials
,
XPS
,
diamond
,
Band bending
Date published
2024-09-02
Updated at
2024-09-13 12:30:32 +0900
Continuous real-time O 1s core XPS spectra of H2O adsorption on +c Ga-face and m-plane surfaces of GaN
Dataset
Creator
SUMIYA, Masatomo
(author) (
Search by this author
)
https://orcid.org/0000-0003-0960-3812
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
SUMIYA, Masatomo
Keyword
GaN
,
Gallium nitride
,
Surface oxidation
,
Oxidation
,
MOS structure
,
XPS
,
SPring-8
Date published
2022-12-31
Updated at
2024-01-05 22:11:14 +0900
Keyword
XPS
(5)
GaN
(2)
Gallium nitride
(2)
Oxidation
(2)
SPring-8
(2)
AES
(1)
Adsorption
(1)
Auger electron spectroscopy
(1)
Band bending
(1)
ISO
(1)
Interface
(1)
International Organization for Standardization
(1)
MOS structure
(1)
MXene
(1)
Surface oxidation
(1)
X-ray photoelectron spectroscopy
(1)
binding energy calibration
(1)
carbon-related materials
(1)
diamond
(1)
quantitative surface analysis
(1)
relative sensitivity factor
(1)
RDE metadata def
RDE invoice schema
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1
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Collection
Resource type
Journal article(3)
Dataset(2)
Keyword
XPS (5)
GaN (2)
Gallium nitride (2)
Oxidation (2)
SPring-8 (2)
AES (1)
Adsorption (1)
Auger electron spectroscopy (1)
Band bending (1)
ISO (1)
(more)
License
Creative Commons BY Attribution 4.0 International (3)
In Copyright (2)
File type
application/pdf (3)
application/zip (2)
image/jpeg (2)
Measurement method
x-ray photoelectron spectroscopy (2)
Instrument name
BL23_XPS (2)
Model number
(2)