Menu
About
Help
Contact
表示言語の変更
日本語
English
Login
Login
Search MDR
Home
Article and Dataset
Collection
Resource type
Journal article(3)
Keyword
TFT (2)
a-IGZO (2)
IGZO (1)
Oxygen defects (1)
contact resistance (1)
hydrogen (1)
mobility (1)
oxide semiconductors (1)
palladium (1)
positive-bias-stress instability (1)
(more)
License
Creative Commons BY Attribution 4.0 International (3)
File type
application/pdf (3)
3 records found. Displaying records 1 to 3.
Origin of Mobility Reduction in Thin a-IGZO TFTs and Its Improvement
Journal article
Creator
Hanjun Cho
(author) (
Search by this author
)
https://orcid.org/0009-0009-2834-8846
(unauthenticated)
Hanjun Cho
;
Masatake Tsuji
(author) (
Search by this author
)
https://orcid.org/0000-0002-3404-6037
(unauthenticated)
Masatake Tsuji
;
Shigenori Ueda
(author) (
Search by this author
)
https://orcid.org/0000-0001-9425-0614
NIMS Researchers Directory SAMURAI
Shigenori Ueda
;
Hideo Hosono
(author) (
Search by this author
)
https://orcid.org/0000-0001-9260-6728
NIMS Researchers Directory SAMURAI
Hideo Hosono
Keyword
a-IGZO
,
mobility
,
TFT
,
surface defects
Date published
2026-05-22
Updated at
2026-08-25 14:17:04 +0900
Oxygen Defects and Instability in Very Thin a‐IGZO TFTs
Journal article
Creator
Hanjun Cho
(author) (
Search by this author
)
https://orcid.org/0009-0009-2834-8846
(unauthenticated)
Hanjun Cho
;
Masatake Tsuji
(author) (
Search by this author
)
https://orcid.org/0000-0002-3404-6037
(unauthenticated)
Masatake Tsuji
;
Shigenori Ueda
(author) (
Search by this author
)
https://orcid.org/0000-0001-9425-0614
NIMS Researchers Directory SAMURAI
Shigenori Ueda
;
Junghwan Kim
(author) (
Search by this author
)
https://orcid.org/0000-0001-9168-6260
(unauthenticated)
Junghwan Kim
;
Hideo Hosono
(author) (
Search by this author
)
https://orcid.org/0000-0001-9260-6728
NIMS Researchers Directory SAMURAI
Hideo Hosono
Keyword
a-IGZO
,
TFT
,
Oxygen defects
,
positive-bias-stress instability
Date published
2025-07-07
Updated at
2025-09-24 12:30:21 +0900
Approach to Low Contact Resistance Formation on Buried Interface in Oxide Thin-Film Transistors: Utilization of Palladium-Mediated Hydrogen Pathway
Journal article
Creator
Yuhao Shi
(author) (
Search by this author
)
https://orcid.org/0000-0002-7956-193X
(unauthenticated)
Yuhao Shi
;
Masatake Tsuji
(author) (
Search by this author
)
https://orcid.org/0000-0002-3404-6037
(unauthenticated)
Masatake Tsuji
;
Hanjun Cho
(author) (
Search by this author
)
https://orcid.org/0009-0009-2834-8846
(unauthenticated)
Hanjun Cho
;
Shigenori Ueda
(author) (
Search by this author
)
https://orcid.org/0000-0001-9425-0614
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Shigenori Ueda
;
Junghwan Kim
(author) (
Search by this author
)
https://orcid.org/0000-0001-9168-6260
(unauthenticated)
Junghwan Kim
;
Hideo Hosono
(author) (
Search by this author
)
https://orcid.org/0000-0001-9260-6728
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hideo Hosono
Keyword
oxide semiconductors
,
IGZO
,
thin-film transistors
,
contact resistance
,
palladium
,
hydrogen
Date published
2024-04-02
Updated at
2024-04-08 16:30:22 +0900
Keyword
TFT
(2)
a-IGZO
(2)
IGZO
(1)
Oxygen defects
(1)
contact resistance
(1)
hydrogen
(1)
mobility
(1)
oxide semiconductors
(1)
palladium
(1)
positive-bias-stress instability
(1)
surface defects
(1)
thin-film transistors
(1)
RDE metadata def
RDE invoice schema
<
1
>
Filter
Collection
Resource type
Journal article(3)
Keyword
TFT (2)
a-IGZO (2)
IGZO (1)
Oxygen defects (1)
contact resistance (1)
hydrogen (1)
mobility (1)
oxide semiconductors (1)
palladium (1)
positive-bias-stress instability (1)
(more)
License
Creative Commons BY Attribution 4.0 International (3)
File type
application/pdf (3)