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Article and Dataset
Collection
Resource type
Journal article(4)
Keyword
TFT (2)
a-IGZO (2)
IGZO (1)
Oxygen defects (1)
contact resistance (1)
dielectrics (1)
hydrogen (1)
mobility (1)
oxide semiconductors (1)
palladium (1)
(more)
License
Creative Commons BY Attribution 4.0 International (3)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (1)
File type
application/pdf (4)
4 records found. Displaying records 1 to 4.
Origin of Mobility Reduction in Thin a-IGZO TFTs and Its Improvement
Journal article
Creator
Hanjun Cho
(author) (
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)
https://orcid.org/0009-0009-2834-8846
(unauthenticated)
Hanjun Cho
;
Masatake Tsuji
(author) (
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)
https://orcid.org/0000-0002-3404-6037
(unauthenticated)
Masatake Tsuji
;
Shigenori Ueda
(author) (
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)
https://orcid.org/0000-0001-9425-0614
NIMS Researchers Directory SAMURAI
Shigenori Ueda
;
Hideo Hosono
(author) (
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)
https://orcid.org/0000-0001-9260-6728
NIMS Researchers Directory SAMURAI
Hideo Hosono
Keyword
a-IGZO
,
mobility
,
TFT
,
surface defects
Date published
2026-05-22
Updated at
2026-08-25 14:17:04 +0900
Oxygen Defects and Instability in Very Thin a‐IGZO TFTs
Journal article
Creator
Hanjun Cho
(author) (
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)
https://orcid.org/0009-0009-2834-8846
(unauthenticated)
Hanjun Cho
;
Masatake Tsuji
(author) (
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)
https://orcid.org/0000-0002-3404-6037
(unauthenticated)
Masatake Tsuji
;
Shigenori Ueda
(author) (
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)
https://orcid.org/0000-0001-9425-0614
NIMS Researchers Directory SAMURAI
Shigenori Ueda
;
Junghwan Kim
(author) (
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)
https://orcid.org/0000-0001-9168-6260
(unauthenticated)
Junghwan Kim
;
Hideo Hosono
(author) (
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)
https://orcid.org/0000-0001-9260-6728
NIMS Researchers Directory SAMURAI
Hideo Hosono
Keyword
a-IGZO
,
TFT
,
Oxygen defects
,
positive-bias-stress instability
Date published
2025-07-07
Updated at
2025-09-24 12:30:21 +0900
Theoretical and data-driven approaches to semiconductors and dielectrics: from prediction to experiment
Journal article
Creator
Fumiyasu Oba
(author) (
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)
https://orcid.org/0000-0001-7178-5333
(unauthenticated)
Fumiyasu Oba
;
Takayuki Nagai
(author) (
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)
https://orcid.org/0009-0001-3284-3737
(unauthenticated)
Takayuki Nagai
;
Ryoji Katsube
(author) (
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)
https://orcid.org/0000-0003-4962-8547
(unauthenticated)
Ryoji Katsube
;
Yasuhide Mochizuki
(author) (
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)
https://orcid.org/0000-0002-8292-7736
(unauthenticated)
Yasuhide Mochizuki
;
Masatake Tsuji
(author) (
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)
https://orcid.org/0000-0002-3404-6037
(unauthenticated)
Masatake Tsuji
;
Guillaume Deffrennes
(author) (
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)
https://orcid.org/0000-0002-3752-2537
(unauthenticated)
Guillaume Deffrennes
;
Kota Hanzawa
(author) (
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)
https://orcid.org/0000-0002-0995-9360
(unauthenticated)
Kota Hanzawa
;
Akitoshi Nakano
(author) (
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)
https://orcid.org/0000-0001-9780-5179
(unauthenticated)
Akitoshi Nakano
;
Akira Takahashi
(author) (
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)
https://orcid.org/0000-0002-3159-9007
(unauthenticated)
Akira Takahashi
;
Kei Terayama
(author) (
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)
https://orcid.org/0000-0003-3914-248X
(unauthenticated)
Kei Terayama
;
Ryo Tamura
(author) (
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)
https://orcid.org/0000-0002-0349-358X
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Ryo Tamura
;
Hidenori Hiramatsu
(author) (
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)
https://orcid.org/0000-0002-5664-5831
(unauthenticated)
Hidenori Hiramatsu
;
Yoshitaro Nose
(author) (
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)
https://orcid.org/0000-0002-8320-1953
(unauthenticated)
Yoshitaro Nose
;
Hiroki Taniguchi
(author) (
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)
https://orcid.org/0000-0002-1773-7856
(unauthenticated)
Hiroki Taniguchi
Keyword
semiconductors
,
dielectrics
Date published
2024-12-31
Updated at
2024-12-25 16:31:05 +0900
Approach to Low Contact Resistance Formation on Buried Interface in Oxide Thin-Film Transistors: Utilization of Palladium-Mediated Hydrogen Pathway
Journal article
Creator
Yuhao Shi
(author) (
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)
https://orcid.org/0000-0002-7956-193X
(unauthenticated)
Yuhao Shi
;
Masatake Tsuji
(author) (
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)
https://orcid.org/0000-0002-3404-6037
(unauthenticated)
Masatake Tsuji
;
Hanjun Cho
(author) (
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)
https://orcid.org/0009-0009-2834-8846
(unauthenticated)
Hanjun Cho
;
Shigenori Ueda
(author) (
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)
https://orcid.org/0000-0001-9425-0614
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Shigenori Ueda
;
Junghwan Kim
(author) (
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)
https://orcid.org/0000-0001-9168-6260
(unauthenticated)
Junghwan Kim
;
Hideo Hosono
(author) (
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)
https://orcid.org/0000-0001-9260-6728
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hideo Hosono
Keyword
oxide semiconductors
,
IGZO
,
thin-film transistors
,
contact resistance
,
palladium
,
hydrogen
Date published
2024-04-02
Updated at
2024-04-08 16:30:22 +0900
Keyword
TFT
(2)
a-IGZO
(2)
IGZO
(1)
Oxygen defects
(1)
contact resistance
(1)
dielectrics
(1)
hydrogen
(1)
mobility
(1)
oxide semiconductors
(1)
palladium
(1)
positive-bias-stress instability
(1)
semiconductors
(1)
surface defects
(1)
thin-film transistors
(1)
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Collection
Resource type
Journal article(4)
Keyword
TFT (2)
a-IGZO (2)
IGZO (1)
Oxygen defects (1)
contact resistance (1)
dielectrics (1)
hydrogen (1)
mobility (1)
oxide semiconductors (1)
palladium (1)
(more)
License
Creative Commons BY Attribution 4.0 International (3)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (1)
File type
application/pdf (4)