Sample structure prediction from measured XPS data using Bayesian estimation and SESSA simulator

Journal article

Creator

Hiroshi Shinotsuka (author) (Search by this author)

https://orcid.org/0000-0001-5147-1396

Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Hiroshi Shinotsuka ;

Kenji Nagata (author) (Search by this author)

https://orcid.org/0000-0001-9894-4461

Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Kenji Nagata ;

Malinda Siriwardana (author) (Search by this author)

Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science

Malinda Siriwardana ;

Hideki Yoshikawa (author) (Search by this author)

https://orcid.org/0000-0002-7389-8865

Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Hideki Yoshikawa ;

Hayaru Shouno (author) (Search by this author)

https://orcid.org/0000-0002-2412-0184 (unauthenticated)

Graduate School of Informatics and Engineering, The University of Electro-Communications

Hayaru Shouno ;

Masato Okada (author) (Search by this author)

https://orcid.org/0000-0002-9040-8784 (unauthenticated)

Graduate School of Frontier Science, The University of Tokyo

Masato Okada

Keyword

X-ray photoelectron spectroscopy, Bayesian estimation, Exchange Monte Carlo method, SESSA

Date published

2023-07-06

Updated at

2024-01-05 22:11:57 +0900