Determining the Electron Scattering from Interfacial Coulomb Scatterers in Two-Dimensional Transistors

Article

Creator

Yi-Te Lee ; Yu-Ting Huang ; Shao-Pin Chiu ; Ruey-Tay Wang ; Takashi Taniguchi ; Kenji Watanabe ; Raman Sankar ; Chi-Te Liang ; Wei-Hua Wang ; Sheng-Shiuan Yeh ; Juhn-Jong Lin

Keyword

electron scattering, 2D materials, Coulomb scattering strength, low-frequency noise, indium selenide, interfacial Coulomb scatterers, 2D transist

Date published

2024-01-10

Updated at

2025-10-21 15:50:45 +0900